JEOL JSM-6510LV/GS Scanning Electron Microscope
The JEOL 6510 LV Scanning Electron Microscope is equipped with a secondary electron detector and backscatter detector for high vacuum applications. It also has an environmental stage capable of low vacuum at variable pressures. The cyro-puck allows for flash freezing of biological samples for viewing at low vacuum.
- Location: KINSC L009
- Contacts: Rachel Hoang, Associate Professor of Biology; Walter Smith, Professor of Physics; Luke Troyon, Biology Instrument Specialist
- Outside Commercial (use)$50.00/hour
- Outside Commercial (technician time) $67.00/hour
- Training $125.00