JEOL JSM-6510LV/GS Scanning Electron Microscope
The JEOL 6510 LV Scanning Electron Microscope is equipped with a secondary electron detector and backscatter detector for high vacuum applications. It also has an environmental stage capable of low vacuum at variable pressures. The cyro-puck allows for flash freezing of biological samples for viewing at low vacuum.
- Location: KINSC L009
- Contacts: rhoang [at] haverford.edu (Rachel Hoang), Associate Professor of Biology; wsmith [at] haverford.edu (Walter Smith), Professor of Physics; ltroyon [at] haverford.edu (Luke Troyon), Biology Instrument Specialist
- Outside Commercial (use)$50.00/hour
- Outside Commercial (technician time) $67.00/hour
- Training $125.00