JEOL JSM-6510LV/GS Scanning Electron Microscope
The JEOL 6510 LV Scanning Electron Microscope is equipped with a secondary electron detector and backscatter detector for high vacuum applications. It also has an environmental stage capable of low vacuum at variable pressures. The cyro-puck allows for flash freezing of biological samples for viewing at low vacuum.
- Location: KINSC L009
- Contacts: rhoang [at] haverford.edu (Rachel Hoang), Associate Professor of Biology; wsmith [at] haverford.edu (Walter Smith), Professor of Physics; ltroyon [at] haverford.edu (Luke Troyon), Biology Instrument Specialist
2016-17 Rates
- Outside Commercial (use)$50.00/hour
- Outside Commercial (technician time) $67.00/hour
- Training $125.00
Electron Microscopy Gallery
Below are images taken by our research laboratories using our JSM 6510LV demonstrating the use of the secondary electron and back scatter electron detectors at high vacuum, as well as flash freezing specimens with the Jeol cryo-puck.
