The JEOL 6510 LV Scanning Electron Microscope is equipped with a secondary electron detector and backscatter detector for high vacuum applications. It also has an environmental stage capable of low vacuum at variable pressures. The cyro-puck allows for flash freezing of biological samples for viewing at low vacuum.
Electron Microscopy Rates 2015-16
Outside Comercial (use)$50.00/hour
Outside Comercial (technician time) $67.00/hour
(610) 896-1349 ltroyon [at] haverford.edu
Electron Microscopy Gallery
Below are images taken by our research laboratories using our JSM 6510LV demonstrating the use of the secondary electron and back scatter electron detectors at high vacuum, as well as flash freezing specimens with the Jeol cryo-puck.